Abstract
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vulnerable to radiation-induced Single Event Upsets (SEUs). Compared with the well-known SEU mitigation solution — Triple Modular Redundancy (TMR) with configuration memory scrubbing — TMR with module-based error recovery (MER) is notably more energy efficient and responsive in repairing soft-errors in the system. Unfortunately, TMR-MER systems also need to resort to scrubbing when errors occur in sub-components, such as nets, which are not recovered by MER. This paper addresses this problem by proposing a fine-grained module-based error recovery technique that without additional system hardware can localize and correct errors that classic MER fails to do. We evaluate our proposal via a fault-injection campaign on a Xilinx Artix-7 application circuit and compare the reliability, the error correction latency and the energy cost of repairing errors, of our proposal with those of a conventional MER approach and with periodic and on-demand blind scrubbing. We find the reliability of our proposal to be the highest and the energy expenditure to be the lowest amongst those methods considered.
Original language | English |
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Title of host publication | Proceedings of the 2016 International Conference on Field-Programmable Technology, FPT 2016 |
Editors | Yuchen Song, Shaojun Wang, Brent Nelson, Junbao Li, Yu Peng |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 101-108 |
Number of pages | 8 |
ISBN (Electronic) | 9781509056026 |
DOIs | |
Publication status | Published - 2017 |
Externally published | Yes |
Event | 15th International Conference on Field-Programmable Technology, FPT 2016 - Xi'an, China Duration: 7 Dec 2016 → 9 Dec 2016 |
Other
Other | 15th International Conference on Field-Programmable Technology, FPT 2016 |
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Country/Territory | China |
City | Xi'an |
Period | 7/12/16 → 9/12/16 |
Keywords
- Field programmable gate arrays
- Integrated circuit interconnections
- Integrated circuit modeling
- Radiation detectors
- Reliability
- Single event upsets
- Tunneling magnetoresistance