Fine-grained module-based error recovery in FPGA-based TMR systems

Zhuoran Zhao, Dimitris Agiakatsikas, Nguyen T. H. Nguyen, Ediz Cetin, Oliver Diessel

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

7 Citations (Scopus)


Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vulnerable to radiation-induced Single Event Upsets (SEUs). Compared with the well-known SEU mitigation solution — Triple Modular Redundancy (TMR) with configuration memory scrubbing — TMR with module-based error recovery (MER) is notably more energy efficient and responsive in repairing soft-errors in the system. Unfortunately, TMR-MER systems also need to resort to scrubbing when errors occur in sub-components, such as nets, which are not recovered by MER. This paper addresses this problem by proposing a fine-grained module-based error recovery technique that without additional system hardware can localize and correct errors that classic MER fails to do. We evaluate our proposal via a fault-injection campaign on a Xilinx Artix-7 application circuit and compare the reliability, the error correction latency and the energy cost of repairing errors, of our proposal with those of a conventional MER approach and with periodic and on-demand blind scrubbing. We find the reliability of our proposal to be the highest and the energy expenditure to be the lowest amongst those methods considered.
Original languageEnglish
Title of host publicationProceedings of the 2016 International Conference on Field-Programmable Technology, FPT 2016
EditorsYuchen Song, Shaojun Wang, Brent Nelson, Junbao Li, Yu Peng
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages8
ISBN (Electronic)9781509056026
Publication statusPublished - 2017
Externally publishedYes
Event15th International Conference on Field-Programmable Technology, FPT 2016 - Xi'an, China
Duration: 7 Dec 20169 Dec 2016


Other15th International Conference on Field-Programmable Technology, FPT 2016


  • Field programmable gate arrays
  • Integrated circuit interconnections
  • Integrated circuit modeling
  • Radiation detectors
  • Reliability
  • Single event upsets
  • Tunneling magnetoresistance


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