Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator

Nitin R. Nand, John G. Hartnett

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

    1 Citation (Scopus)

    Abstract

    A previously implemented Cryogenic Sapphire Oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 × 10-16 at 20 s, a long-term frequency drift less than 1 × 10-14/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.

    Original languageEnglish
    Title of host publication2010 IEEE International Frequency Control Symposium, FCS 2010
    Pages670-673
    Number of pages4
    DOIs
    Publication statusPublished - 2010
    Event2010 IEEE International Frequency Control Symposium, FCS 2010 - Newport Beach, CA, United States
    Duration: 1 Jun 20104 Jun 2010

    Other

    Other2010 IEEE International Frequency Control Symposium, FCS 2010
    Country/TerritoryUnited States
    CityNewport Beach, CA
    Period1/06/104/06/10

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