Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator

Nitin R. Nand, John G. Hartnett

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

1 Citation (Scopus)

Abstract

A previously implemented Cryogenic Sapphire Oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 × 10-16 at 20 s, a long-term frequency drift less than 1 × 10-14/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.

Original languageEnglish
Title of host publication2010 IEEE International Frequency Control Symposium, FCS 2010
Pages670-673
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 IEEE International Frequency Control Symposium, FCS 2010 - Newport Beach, CA, United States
Duration: 1 Jun 20104 Jun 2010

Other

Other2010 IEEE International Frequency Control Symposium, FCS 2010
CountryUnited States
CityNewport Beach, CA
Period1/06/104/06/10

Fingerprint Dive into the research topics of 'Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator'. Together they form a unique fingerprint.

Cite this