Gamma-ray detectors from thermally annealed Bridgman-grown CdTe

D. Alexiev*, K. S A Butcher, A. A. Williams

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5% full width at half maximum. Energy resolution was ∼ 13.5% for 185 keV γ-rays from a235U (93%) source.

Original languageEnglish
Pages (from-to)303-309
Number of pages7
JournalJournal of Crystal Growth
Issue number3-4
Publication statusPublished - 2 Sep 1994


Dive into the research topics of 'Gamma-ray detectors from thermally annealed Bridgman-grown CdTe'. Together they form a unique fingerprint.

Cite this