Abstract
The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5% full width at half maximum. Energy resolution was ∼ 13.5% for 185 keV γ-rays from a235U (93%) source.
Original language | English |
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Pages (from-to) | 303-309 |
Number of pages | 7 |
Journal | Journal of Crystal Growth |
Volume | 142 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - 2 Sep 1994 |