Gamma-ray detectors from thermally annealed Bridgman-grown CdTe

D. Alexiev; K. S A Butcher; A. A. Williams

doi:10.1016/0022-0248(94)90336-0

Gamma-ray detectors from thermally annealed Bridgman-grown CdTe

D. Alexiev^*, K. S A Butcher, A. A. Williams

^*Corresponding author for this work

Faculty of Science and Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5% full width at half maximum. Energy resolution was ∼ 13.5% for 185 keV γ-rays from a²³⁵U (93%) source.

Original language	English
Pages (from-to)	303-309
Number of pages	7
Journal	Journal of Crystal Growth
Volume	142
Issue number	3-4
DOIs	https://doi.org/10.1016/0022-0248(94)90336-0
Publication status	Published - 2 Sept 1994

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title = "Gamma-ray detectors from thermally annealed Bridgman-grown CdTe",

abstract = "The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5\% full width at half maximum. Energy resolution was ∼ 13.5\% for 185 keV γ-rays from a235U (93\%) source.",

author = "D. Alexiev and Butcher, \{K. S A\} and Williams, \{A. A.\}",

year = "1994",

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doi = "10.1016/0022-0248(94)90336-0",

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journal = "Journal of Crystal Growth",

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T1 - Gamma-ray detectors from thermally annealed Bridgman-grown CdTe

AU - Alexiev, D.

AU - Butcher, K. S A

AU - Williams, A. A.

PY - 1994/9/2

Y1 - 1994/9/2

N2 - The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5% full width at half maximum. Energy resolution was ∼ 13.5% for 185 keV γ-rays from a235U (93%) source.

AB - The characteristics of small γ-ray probe detectors (hemispherical contact geometry) made from Cl- and In-doped Bridgman-grown crystals of CdTe are described. A slow, low-temperature anneal of as-grown CdTe ranging from 485 to 85°C, and cooled at a rate of < 20°C/h, was found to greatly improve detector performance. Best photopeak to Compton edge ratios were 2:1 for 662 keV γ-rays. Typical values were 1:1 with energy resolutions of 5% full width at half maximum. Energy resolution was ∼ 13.5% for 185 keV γ-rays from a235U (93%) source.

UR - https://www.scopus.com/pages/publications/0028761468

U2 - 10.1016/0022-0248(94)90336-0

DO - 10.1016/0022-0248(94)90336-0

M3 - Article

AN - SCOPUS:0028761468

SN - 0022-0248

VL - 142

SP - 303

EP - 309

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 3-4

ER -

Gamma-ray detectors from thermally annealed Bridgman-grown CdTe

Abstract

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