TY - GEN
T1 - Glass substrates for GaN using ZnO buffer layers
AU - Butcher, K. S. A.
AU - Afifuddin, null
AU - Chen, Patrick P. -T.
AU - Godlewski, M.
AU - Szczerbakow, A.
AU - Goldys, E. M.
AU - Tansley, T. L.
AU - Freitas, J. A.
N1 - Copyright 2002 IEEE. Reprinted from Proceedings of the 2000 conference on optoelectronic and microelectronic materials and devices. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2000
Y1 - 2000
N2 - Polycrystalline GaN has been grown by remote plasma enhanced laser induced chemical vapour deposition on soda lime glass substrates using ZnO buffer layers. The high compliance of the ZnO has allowed relatively thick layers of 5-10 microns to be produced on these inexpensive substrate materials. These were subsequently processed into free standing layers. Hall mobilities have been measured for n-type GaN deposited on the ZnO buffered glass substrates, with the results equaling the highest values obtained by others using MBE and high purity silica substrates.
AB - Polycrystalline GaN has been grown by remote plasma enhanced laser induced chemical vapour deposition on soda lime glass substrates using ZnO buffer layers. The high compliance of the ZnO has allowed relatively thick layers of 5-10 microns to be produced on these inexpensive substrate materials. These were subsequently processed into free standing layers. Hall mobilities have been measured for n-type GaN deposited on the ZnO buffered glass substrates, with the results equaling the highest values obtained by others using MBE and high purity silica substrates.
UR - http://www.scopus.com/inward/record.url?scp=84949802701&partnerID=8YFLogxK
U2 - 10.1109/COMMAD.2000.1023005
DO - 10.1109/COMMAD.2000.1023005
M3 - Conference proceeding contribution
AN - SCOPUS:84949802701
SN - 0780366980
VL - 2000-January
SP - 535
EP - 538
BT - COMMAD 2000 Proceedings - Conference on Optoelectronic and Microelectronic Materials and Devices
A2 - Broekman, Leonard
A2 - Usher, Brian
A2 - Riley, John
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Bundoora, Victoria, Australia,
T2 - Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2000
Y2 - 6 December 2000 through 8 December 2000
ER -