Abstract
Growth of microcrystalline GaN films by microwave plasma assisted laserinduced chemical vapour deposition has been studied in the temperature range of 525 °C - 650 °C for growth on sapphire and silicon. The influence of substrate temperature is discussed and growth mechanisms are explained. Properties of the GaN films are measured by X-ray diffraction and optical transmission spectroscopy.
| Original language | English |
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| Title of host publication | COMMAD 2000 Proceedings - Conference on Optoelectronic and Microelectronic Materials and Devices |
| Editors | Leonard Broekman, Brian Usher, John Riley |
| Place of Publication | Piscataway, NJ |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 129-132 |
| Number of pages | 4 |
| Volume | 2000-January |
| ISBN (Electronic) | 0780366980 |
| DOIs | |
| Publication status | Published - 2000 |
| Event | Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2000 - Bundoora, Australia Duration: 6 Dec 2000 → 8 Dec 2000 |
Other
| Other | Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2000 |
|---|---|
| Country/Territory | Australia |
| City | Bundoora |
| Period | 6/12/00 → 8/12/00 |