For structural investigation, highly (112) oriented tetragonal Cu2ZnSnS4 (CZTS) thin films on hexagonal sapphire (0001) single crystal substrates were obtained by radio frequency (RE) magnetron sputtering. The influences of the deposition parameters, such as substrate temperature (TSub) and working Ar pressure (Par) on the chemical composition and structural properties of as deposited CZTS films were investigated. The film sputtered at 500°C has the only orientation of (112), also, it bears the best structural quality with pure CZTS phase and an estimated band gap of 1.5 leV.
|Number of pages||5|
|Journal||MRS Online Proceedings|
|Early online date||6 May 2014|
|Publication status||Published - 2014|
|Event||2013 MRS Fall Meeting - Boston, United States|
Duration: 1 Dec 2013 → 6 Dec 2013