TY - GEN
T1 - Hedged deep tracking
AU - Qi, Yuankai
AU - Zhang, Shengping
AU - Qin, Lei
AU - Yao, Hongxun
AU - Huang, Qingming
AU - Lim, Jongwoo
AU - Yang, Ming-Hsuan
PY - 2016
Y1 - 2016
N2 - In recent years, several methods have been developed to utilize hierarchical features learned from a deep convolutional neural network (CNN) for visual tracking. However, as features from a certain CNN layer characterize an object of interest from only one aspect or one level, the performance of such trackers trained with features from one layer (usually the second to last layer) can be further improved. In this paper, we propose a novel CNN based tracking framework, which takes full advantage of features from different CNN layers and uses an adaptive Hedge method to hedge several CNN based trackers into a single stronger one. Extensive experiments on a benchmark dataset of 100 challenging image sequences demonstrate the effectiveness of the proposed algorithm compared to several state-of-theart trackers.
AB - In recent years, several methods have been developed to utilize hierarchical features learned from a deep convolutional neural network (CNN) for visual tracking. However, as features from a certain CNN layer characterize an object of interest from only one aspect or one level, the performance of such trackers trained with features from one layer (usually the second to last layer) can be further improved. In this paper, we propose a novel CNN based tracking framework, which takes full advantage of features from different CNN layers and uses an adaptive Hedge method to hedge several CNN based trackers into a single stronger one. Extensive experiments on a benchmark dataset of 100 challenging image sequences demonstrate the effectiveness of the proposed algorithm compared to several state-of-theart trackers.
UR - http://www.scopus.com/inward/record.url?scp=84986246054&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2016.466
DO - 10.1109/CVPR.2016.466
M3 - Conference proceeding contribution
AN - SCOPUS:84986246054
SN - 9781467388528
SP - 4303
EP - 4311
BT - 29th IEEE Conference on Computer Vision and Pattern Recognition
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Piscataway, NJ
T2 - 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016
Y2 - 26 June 2016 through 1 July 2016
ER -