Helium ion microscopy and energy selective scanning electron microscopy- two advanced microscopy techniques with complementary applications

C. Rodenburg, M. A. E. Jepson, Stuart A. Boden, Darren M. Bagnall

Research output: Contribution to journalConference paper

2 Citations (Scopus)
6 Downloads (Pure)

Abstract

Both scanning electron microscopes (SEM) and helium ion microscopes (HeIM) are based on the same principle of a charged particle beam scanning across the surface and generating secondary electrons (SEs) to form images. However, there is a pronounced difference in the energy spectra of the emitted secondary electrons emitted as result of electron or helium ion impact. We have previously presented evidence that this also translates to differences in the information depth through the analysis of dopant contrast in doped silicon structures in both SEM and HeIM. Here, it is now shown how secondary electron emission spectra (SES) and their relation to depth of origin of SE can be experimentally exploited through the use of energy filtering (EF) in low voltage SEM (LV-SEM) to access bulk information from surfaces covered by damage or contamination layers. From the current understanding of the SES in HeIM it is not expected that EF will be as effective in HeIM but an alternative that can be used for some materials to access bulk information is presented.

Original languageEnglish
Article number012049
Pages (from-to)1-5
Number of pages5
JournalJournal of Physics: Conference Series
Volume522
DOIs
Publication statusPublished - 2014
Externally publishedYes

Bibliographical note

Copyright the Author(s) 2014. Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.

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