HEMT model based on the Parker-Skellern MESFET model

D. R. Webster*, A. E. Parker, D. G. Haigh

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    A HEMT model based on the Parker-Skellern MESFET model is presented. The model correctly exhibits a fall in transconductance at high gate bias together with frequency dispersion in both transconductance and output conductance. This is verified using a comparison with measured results.

    Original languageEnglish
    Pages (from-to)493-494
    Number of pages2
    JournalElectronics Letters
    Volume32
    Issue number5
    Publication statusPublished - 29 Feb 1996

    Keywords

    • CAD
    • High electron mobility transistors
    • Semiconductor device models

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