TY - GEN
T1 - High energy laser pulse irradiation of a silica microsphere on a glass surface for sub-micron patterning
AU - Kane, D. M.
AU - Joyce, A. M.
N1 - Copyright 2006 IEEE. Reprinted from 2006 International conference on nanoscience and nanotechnology : proceedings. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2006/7
Y1 - 2006/7
N2 - Irradiating silica microspheres, on a silica or glass surface, with single, high-energy, laser pulses from a KrF excimer laser, has generated a wealth of different micron and sub-micron, topological patterns in the substrate. Optical surface profilometry has been used as the experimental technique to study the patterns formed. Comparison of the experimental results with theoretical results from sophisticated models developed by Lukyanchuk and co-workers, and Arnold and co-workers is presented.
AB - Irradiating silica microspheres, on a silica or glass surface, with single, high-energy, laser pulses from a KrF excimer laser, has generated a wealth of different micron and sub-micron, topological patterns in the substrate. Optical surface profilometry has been used as the experimental technique to study the patterns formed. Comparison of the experimental results with theoretical results from sophisticated models developed by Lukyanchuk and co-workers, and Arnold and co-workers is presented.
UR - http://www.scopus.com/inward/record.url?scp=48749110013&partnerID=8YFLogxK
U2 - 10.1109/ICONN.2006.340541
DO - 10.1109/ICONN.2006.340541
M3 - Conference proceeding contribution
AN - SCOPUS:48749110013
SN - 1424404525
SN - 9781424404537
SP - 27
EP - 30
BT - 2006 International Conference on Nanoscience and Nanotechnology
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Piscataway, N.J.
T2 - 2006 International Conference on Nanoscience and Nanotechnology, ICONN 2006
Y2 - 3 July 2006 through 6 July 2006
ER -