Abstract
Electron beam lithography has been applied to the fabrication of nanoscale two-dimensional chiral structures with various designs. A fabrication process for planar chiral structures in a thin silicon nitride layer using electron beam lithography and dry etching is presented. A top conductive coating is applied during electron-beam exposure to prevent the occurrence of charging effects caused by the non-conductive silica substrate. Different doses are chosen during the lithography process depending on the complexities and densities of different chiral designs. A very well defined transmission diffraction pattern from arrays of Peano-Gosper fractals is obtained. The optical activity of these dielectric metamaterials shows great potential in their applications of optoelectronic devices and communications.
Original language | English |
---|---|
Pages (from-to) | 3714-3717 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 515 |
Issue number | 7-8 |
DOIs | |
Publication status | Published - 26 Feb 2007 |
Externally published | Yes |
Keywords
- electron beam lithography
- planar chiral metamaterials
- polarization state
- proximity effect