High resolution mapping of the dynamics of a nonlinear semiconductor laser system

Optical feedback is known to cause a range of complex dynamical states in the output power of semiconductor lasers. These types of systems have been much studied [1]. The dynamic state of the laser output can be controlled by varying the level of optical feedback and also the injection current to the laser [2]. Traditionally, analysis of nonlinear dynamics produced by semiconductor lasers has been based on optical and/or RF spectra, due to the high frequencies involved. More recently, the availability of high bandwidth real-time oscilloscopes has facilitated direct measurement of the output power time series and allowed the temporal information, missing from earlier investigations, to be captured. Computer controlled experimental setups have also improved the resolution at which system parameters can be varied and the amount of data that can be captured.