Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy

Andrew J. Pearson*, Stuart A. Boden, Darren M. Bagnall, David G. Lidzey, Cornelia Rodenburg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)

Abstract

We use helium ion microscopy (HeIM) to image the nanostructure of poly(3-hexylthiophene)/[6,6]-phenyl-C61-butric acid methyl ester (P3HT/PCBM) blend thin-films. Specifically, we study a blend thin-film subject to a thermal anneal at 140°C and use a plasma-etching technique to gain access to the bulk of the blend thin-films. We observe a domain structure within the bulk of the film that is not apparent at the film-surface and tentatively identify a network of slightly elongated PCBM domains having a spatial periodicity of (20 ± 4) nm a length of (12 ± 8) nm.

Original languageEnglish
Pages (from-to)4275-4281
Number of pages7
JournalNano Letters
Volume11
Issue number10
DOIs
Publication statusPublished - 12 Oct 2011
Externally publishedYes

Keywords

  • helium ion microscopy
  • P3HT
  • PCBM
  • polymer solar cells

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