TY - GEN
T1 - Impact of the semiconductor diode structure on the virtual local oscillator leakage of GaAs sub-harmonic mixers
AU - Gutta, Venkata
AU - Parker, Anthony E.
AU - Fattorini, Anthony
N1 - Copyright 2010 IEEE. Reprinted from 2009 IEEE MTT-S International Microwave Symposium digest : 7-12 June, Boston Convention & Exhibition Center. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2009/6
Y1 - 2009/6
N2 - Diode mismatch in an anti-parallel diode mixer results in an unwanted virtual leakage at twice the local oscillator pumping frequency. Random variability in a fabrication process is one of the sources of diode mismatch. In some fabrication processes, a diode usually consists of a transistor with source and drain shorted together. The layout of this structure introduces a systematic source of diode mismatch. An informed selection of the fabrication process is crucial in minimizing the systematic source of diode mismatch and improving the virtual local oscillator leakage.
AB - Diode mismatch in an anti-parallel diode mixer results in an unwanted virtual leakage at twice the local oscillator pumping frequency. Random variability in a fabrication process is one of the sources of diode mismatch. In some fabrication processes, a diode usually consists of a transistor with source and drain shorted together. The layout of this structure introduces a systematic source of diode mismatch. An informed selection of the fabrication process is crucial in minimizing the systematic source of diode mismatch and improving the virtual local oscillator leakage.
UR - http://www.scopus.com/inward/record.url?scp=73049099984&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2009.5165995
DO - 10.1109/MWSYM.2009.5165995
M3 - Conference proceeding contribution
AN - SCOPUS:73049099984
SN - 9781424428038
SP - 1509
EP - 1512
BT - IMS 2009 - 2009 IEEE MTT-S International Microwave Symposium Digest
A2 - Gouker, Mark
A2 - Kushner, Larry
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Piscataway, NJ
T2 - 2009 IEEE MTT-S International Microwave Symposium, IMS - 2009
Y2 - 7 June 2009 through 12 June 2009
ER -