Imperfections in micro-optics characterised using focussed ion beam sectioning and imaging

D. M. Kane*, R. J. Chater, D. S. McPhail

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Imperfections in micro-optics characterised using focussed ion beam sectioning and imaging'. Together they form a unique fingerprint.

Engineering & Materials Science