Improvement of precision and recall for information retrieval in a narrow domain

Reuse of concepts by formal concept analysis

W. C. Cho*, D. Richards

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

13 Citations (Scopus)

Abstract

With the exponential growth of the World Wide Web (WWW), it has become the most popular place to gather information. However the size of the WWW makes it difficult for people to locate relevant information. About 85 % of all Web users use search engines of some kind for this purpose. However, existing search engines often do not return relevant information. The main focus of this paper is to improve search performance by using keywords and web pages which have been previously used or visited by other users. The Formal Concept Analysis (FCA) method has been adapted to maintain a concept map of keywords. This paper shows how both precision and recall has improved the specific-domain area, in which users can share the same knowledge.

Original languageEnglish
Title of host publicationProceedings - IEEE/WIC/ACM International Conference on Web Intelligence, WI 2004
EditorsN. Zhong, H. Tirri, V. Yao, L. Zhou, Jiming Liu, Nick Cerrone
Place of PublicationLos Alamitos, CA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages370-376
Number of pages7
ISBN (Print)0769521002, 9780769521008
DOIs
Publication statusPublished - 2004
EventProceedings - IEEE/WIC/ACM International Conference on Web Intelligence, WI 2004 - Beijing, China
Duration: 20 Sep 200424 Sep 2004

Other

OtherProceedings - IEEE/WIC/ACM International Conference on Web Intelligence, WI 2004
CountryChina
CityBeijing
Period20/09/0424/09/04

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    Cho, W. C., & Richards, D. (2004). Improvement of precision and recall for information retrieval in a narrow domain: Reuse of concepts by formal concept analysis. In N. Zhong, H. Tirri, V. Yao, L. Zhou, J. Liu, & N. Cerrone (Eds.), Proceedings - IEEE/WIC/ACM International Conference on Web Intelligence, WI 2004 (pp. 370-376). Los Alamitos, CA: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/WI.2004.10082