Improving hole extraction for PbS quantum dot solar cells

Shujuan Huang, Long Hu, Robert Patterson, Zhilong Zhang, Lin Yuan, Weijian Chen, Yicong Hu, Zihan Chen, Yijun Gao, Zhi Li Teh, Chang Yan, Gavin J. Conibeer

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

1 Citation (Scopus)

Abstract

Colloidal quantum dots (CQDs) are promising candidates for low-cost and high efficiency light harvesting materials owing to their solution processability and bandgap tunability. The most efficient lead chalcogenide QD solar cell reported to date is based on PbS, with a power conversion efficiency of 11.3%. However, in a typical QD cell, the hole transport layer has a much lower mobility than that of the ilayer, which hinders the hole extraction. In this work, we use Ag doped PbS QDs to form the p-type layer to increase its mobility and conductivity and significantly improve the device performance from 9.1% to 10.6% of power conversion efficiency.

Original languageEnglish
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages2756-2758
Number of pages3
ISBN (Electronic)9781538685297
ISBN (Print)9781538685303
DOIs
Publication statusPublished - 2018
Externally publishedYes
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: 10 Jun 201815 Jun 2018

Publication series

Name
ISSN (Print)0160-8371

Conference

Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period10/06/1815/06/18

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  • Cite this

    Huang, S., Hu, L., Patterson, R., Zhang, Z., Yuan, L., Chen, W., ... Conibeer, G. J. (2018). Improving hole extraction for PbS quantum dot solar cells. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC) (pp. 2756-2758). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PVSC.2018.8547703