Abstract
Effects of n-type doping of GaN epilayers and InGaN/GaN quantum well structures are studied. We evaluate the influence of n-type doping on a structural quality of the samples (using atomic force and scanning electron microscopy), on light emission intensity and on in-plane emission intensity variations. Possible mechanisms responsible for strong enhancement of light emission from doped samples are discussed.
Original language | English |
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Pages (from-to) | 1056-1059 |
Number of pages | 4 |
Journal | Physica Status Solidi C: Conferences |
Volume | 2 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2005 |