Abstract
We compared the sensitivity to X-rays of several fiber Bragg gratings (FBGs) written in the standard telecommunication fiber Corning SMF28 with different techniques. Standard gratings were manufactured with phase-mask and UV lasers, continuum wave (cw) at 244 nm or pulsed in the nanosecond domain at 248 nm, in a pre-hydrogenated fiber. Others gratings were written by exposures to a femtosecond IR-laser (800 nm), with both phase-mask and point by point techniques. The response of these FBGs was studied under X-rays at room temperature and 100°C, by highlighting their similarities and differences. Independently of the inscription technique, the two types of fs-FBGs have showed no big difference up to 1 MGy(SiO2) dose. A discussion on the causes of the radiation-induced peak change is also reported.
Original language | English |
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Pages (from-to) | 8659-8669 |
Number of pages | 11 |
Journal | Optics Express |
Volume | 23 |
Issue number | 7 |
DOIs | |
Publication status | Published - 6 Apr 2015 |