Abstract
In this letter we examine an influence of surface morphology on yellow and edge emissions in wurtzite phase GaN. Our cathodoluminescence measurements show that the yellow emission does not correlate with the surface morphology, but simultaneously the "edge" emission shows very strong spatial fluctuations. The observed effect is attributed to granular structures in GaN films and enhancement of the yellow emission in the interface region.
Original language | English |
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Pages (from-to) | 3686-3688 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 73 |
Issue number | 25 |
DOIs | |
Publication status | Published - 1998 |