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Interplay between point and extended defects and their effects on Jerky Domain-Wall Motion in ferroelectric thin films

Ralph Bulanadi*, Kumara Cordero-Edwards, Philippe Tückmantel, Sahar Saremi, Giacomo Morpurgo, Qi Zhang, Lane W. Martin, Valanoor Nagarajan, Patrycja Paruch

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Defects have a significant influence on the polarization and electromechanical properties of ferroelectric materials. Statistically, they can be seen as random pinning centers acting on an elastic manifold, slowing domain-wall propagation and raising the energy required to switch polarization. Here we show that the "dressing"of defects can lead to unprecedented control of domain-wall dynamics. We engineer defects of two different dimensionalities in ferroelectric oxide thin films - point defects externally induced via He2+ bombardment, and extended quasi-one-dimensional a domains formed in response to internal strains. The a domains act as extended strong pinning sites (as expected) imposing highly localized directional constraints. Surprisingly, the induced point defects in the He2+ bombarded samples orient and align to impose further directional pinning, screening the effect of a domains. This defect interplay produces more uniform and predictable domain-wall dynamics. Such engineered interactions between defects are crucial for advancements in ferroelectric devices.

Original languageEnglish
Article number106801
Pages (from-to)1-7
Number of pages7
JournalPhysical Review Letters
Volume133
Issue number10
DOIs
Publication statusPublished - 6 Sept 2024
Externally publishedYes

Bibliographical note

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