Intrinsic reduction of the ordered 4 f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN

D. L. Cortie, J. D. Brown, S. Brück, T. Saerbeck, J. P. Evans, H. Fritzsche, X. L. Wang, J. E. Downes, F. Klose

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7 Citations (Scopus)

Abstract

Polarized neutron reflectometry and x-ray reflectometry were used to determine the nanoscale magnetic and chemical depth profiles of the heavy rare-earth nitrides HoN, ErN, and DyN in the form of 15-to 40-nm-thick films. The net ferromagnetic components are much lower than the predictions of density-functional theory and Hund's rules for a simple ferromagnetic ground state in these 4f ionic materials, which points to the intrinsic contribution of crystal-field effects and noncollinear spin structures. The magnetic moment per rare-earth ion was determined as a function of temperature in the range 5-100 K at fields of 1-4 T. It is demonstrated that the films are stoichiometric within 1-3% and magnetically homogeneous on the nanometer scale.

Original languageEnglish
Article number064424
Pages (from-to)1-7
Number of pages7
JournalPhysical Review B: Condensed Matter and Materials Physics
Volume89
Issue number6
DOIs
Publication statusPublished - 26 Feb 2014

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