Investigating spectrograph design parameters with the Yale Doppler diagnostic facility

Christian Schwab*, Thales Gutcke, Julien F P Spronck, Debra A. Fischer, Andrew Szymkowiak

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

5 Citations (Scopus)


The detection of earth-like exoplanets with the Doppler technique requires extreme precision spectrographs stable over timescales of years. The precision requirement of 10 cm/s is equivalent to a relative uncertainty of 3x10 -10, and, with the typical dispersion of the Echelle spectrographs used for this purpose, translates to a shift of a few nanometers of the spectrum on the detector. Consequently, the instrument must be well understood and optimized in every component and detail. We describe the Yale Doppler diagnostic facility (YDDF), a dedicated bench mounted Echelle spectrograph in our lab at Yale University, which will be used to systematically study the influence of different components at this precision level. The spectrograph bench allows for a flexible optical configuration, high resolution and sampling, and wide spectral coverage. Further, we incorporated a turbulence and guiding simulator to realistically reproduce the situation at the telescope, enabling end-to-end tests of important parameters.

Original languageEnglish
Title of host publicationGround-Based and Airborne Instrumentation for Astronomy IV
EditorsIan S. McLean, Suzanne K. Ramsay, Hideki Takami
Place of PublicationBellingham, WA
Number of pages10
ISBN (Print)9780819491473
Publication statusPublished - 2012
Externally publishedYes
EventGround-Based and Airborne Instrumentation for Astronomy IV - Amsterdam, Netherlands
Duration: 1 Jul 20126 Jul 2012


OtherGround-Based and Airborne Instrumentation for Astronomy IV


  • Doppler method
  • Echelle
  • Exoplanets
  • Iodine cell
  • Radial velocities
  • Spectrograph
  • Spectroscopy

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