Investigation of reflection area on strategic reflectarray resonant elements

M. Y. Ismail; Arslan Kiyani

doi:10.1109/ISWTA.2013.6688805

Investigation of reflection area on strategic reflectarray resonant elements

M. Y. Ismail, Arslan Kiyani

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

3 Citations (Scopus)

Abstract

Selection of strategic resonant elements plays an effective role in enhancing the reflectivity performance of reflectarrays. This paper presents a systematic analysis of various potential reflectarray resonant elements for operation at X-band (8-12GHz) frequency range. The considerations mainly focus on the exploitation of reflection area for an accurate characterization of reflection loss and reflection phase performance. Furthermore, two patch unit cells have been fabricated for each configuration by mounting on the top of the Rogers RT/Duroid 5870 dielectric substrate. The scattering parameter measurements of the fabricated unit cells have also been carried out using vector network analyzer based on waveguide simulator technique. Measured results demonstrated that reduction in reflection area of resonant elements from 105.74mm² to 7.33mm² tends to increase the reflection loss values from 2.63dB to 20.25dB. Moreover the reduction in phase errors offering an increased measured static phase range of 290° is also shown by employing triangular loop element.

Original language	English
Title of host publication	2013 IEEE Symposium on Wireless Technology and Applications
Subtitle of host publication	ISWTA 2013
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	363-367
Number of pages	5
ISBN (Electronic)	9781479901562
ISBN (Print)	9781479901555
DOIs	https://doi.org/10.1109/ISWTA.2013.6688805
Publication status	Published - 2013
Externally published	Yes
Event	2013 3rd IEEE Symposium on Wireless Technology and Applications, ISWTA 2013 - Kuching, Malaysia Duration: 22 Sep 2013 → 25 Sep 2013

Other

Other	2013 3rd IEEE Symposium on Wireless Technology and Applications, ISWTA 2013
Country/Territory	Malaysia
City	Kuching
Period	22/09/13 → 25/09/13

Keywords

figure of merit
phase errors
reflectarray
reflection area
reflection loss
reflection phase
resonant elements
scattring parameters
static phase range
waveguide simulator
X-band

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10.1109/ISWTA.2013.6688805

Cite this

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title = "Investigation of reflection area on strategic reflectarray resonant elements",

abstract = "Selection of strategic resonant elements plays an effective role in enhancing the reflectivity performance of reflectarrays. This paper presents a systematic analysis of various potential reflectarray resonant elements for operation at X-band (8-12GHz) frequency range. The considerations mainly focus on the exploitation of reflection area for an accurate characterization of reflection loss and reflection phase performance. Furthermore, two patch unit cells have been fabricated for each configuration by mounting on the top of the Rogers RT/Duroid 5870 dielectric substrate. The scattering parameter measurements of the fabricated unit cells have also been carried out using vector network analyzer based on waveguide simulator technique. Measured results demonstrated that reduction in reflection area of resonant elements from 105.74mm2 to 7.33mm2 tends to increase the reflection loss values from 2.63dB to 20.25dB. Moreover the reduction in phase errors offering an increased measured static phase range of 290° is also shown by employing triangular loop element.",

keywords = "figure of merit, phase errors, reflectarray, reflection area, reflection loss, reflection phase, resonant elements, scattring parameters, static phase range, waveguide simulator, X-band",

author = "Ismail, {M. Y.} and Arslan Kiyani",

year = "2013",

doi = "10.1109/ISWTA.2013.6688805",

language = "English",

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pages = "363--367",

booktitle = "2013 IEEE Symposium on Wireless Technology and Applications",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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note = "2013 3rd IEEE Symposium on Wireless Technology and Applications, ISWTA 2013 ; Conference date: 22-09-2013 Through 25-09-2013",

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Ismail, MY & Kiyani, A 2013, Investigation of reflection area on strategic reflectarray resonant elements. in 2013 IEEE Symposium on Wireless Technology and Applications: ISWTA 2013., 6688805, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 363-367, 2013 3rd IEEE Symposium on Wireless Technology and Applications, ISWTA 2013, Kuching, Malaysia, 22/09/13. https://doi.org/10.1109/ISWTA.2013.6688805

Investigation of reflection area on strategic reflectarray resonant elements. / Ismail, M. Y.; Kiyani, Arslan.

2013 IEEE Symposium on Wireless Technology and Applications: ISWTA 2013. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2013. p. 363-367 6688805.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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AU - Ismail, M. Y.

AU - Kiyani, Arslan

PY - 2013

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N2 - Selection of strategic resonant elements plays an effective role in enhancing the reflectivity performance of reflectarrays. This paper presents a systematic analysis of various potential reflectarray resonant elements for operation at X-band (8-12GHz) frequency range. The considerations mainly focus on the exploitation of reflection area for an accurate characterization of reflection loss and reflection phase performance. Furthermore, two patch unit cells have been fabricated for each configuration by mounting on the top of the Rogers RT/Duroid 5870 dielectric substrate. The scattering parameter measurements of the fabricated unit cells have also been carried out using vector network analyzer based on waveguide simulator technique. Measured results demonstrated that reduction in reflection area of resonant elements from 105.74mm2 to 7.33mm2 tends to increase the reflection loss values from 2.63dB to 20.25dB. Moreover the reduction in phase errors offering an increased measured static phase range of 290° is also shown by employing triangular loop element.

AB - Selection of strategic resonant elements plays an effective role in enhancing the reflectivity performance of reflectarrays. This paper presents a systematic analysis of various potential reflectarray resonant elements for operation at X-band (8-12GHz) frequency range. The considerations mainly focus on the exploitation of reflection area for an accurate characterization of reflection loss and reflection phase performance. Furthermore, two patch unit cells have been fabricated for each configuration by mounting on the top of the Rogers RT/Duroid 5870 dielectric substrate. The scattering parameter measurements of the fabricated unit cells have also been carried out using vector network analyzer based on waveguide simulator technique. Measured results demonstrated that reduction in reflection area of resonant elements from 105.74mm2 to 7.33mm2 tends to increase the reflection loss values from 2.63dB to 20.25dB. Moreover the reduction in phase errors offering an increased measured static phase range of 290° is also shown by employing triangular loop element.

KW - figure of merit

KW - phase errors

KW - reflectarray

KW - reflection area

KW - reflection loss

KW - reflection phase

KW - resonant elements

KW - scattring parameters

KW - static phase range

KW - waveguide simulator

KW - X-band

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ER -

Investigation of reflection area on strategic reflectarray resonant elements

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