Iterative region of interest reconstruction in emission tomography

Jun Ma*

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    1 Citation (Scopus)
    28 Downloads (Pure)

    Abstract

    This paper proposes a new method for region of interest reconstruction in emission tomography assuming projections from the entire field of view (FOV) are available. Unlike some other region of interest evaluation approaches where the system matrix is reformulated simply by summations over columns corresponding to pixels outside the region of interest, our approach reformulates the system matrix using the Bayes probability formula. The simulation study reveals that our method outperforms the traditional approaches judged by reconstruction quality.

    Original languageEnglish
    Title of host publication2010 7th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2010 - Proceedings
    Place of PublicationPiscataway, NJ
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages604-607
    Number of pages4
    ISBN (Print)9781424441266
    DOIs
    Publication statusPublished - 2010
    Event7th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2010 - Rotterdam, Netherlands
    Duration: 14 Apr 201017 Apr 2010

    Other

    Other7th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2010
    Country/TerritoryNetherlands
    CityRotterdam
    Period14/04/1017/04/10

    Bibliographical note

    Copyright 2010 IEEE. Reprinted from 2010 7th IEEE International Symposium on Biomedical Imaging : from nano to macro : proceedings : April 14-17, 2010, Congress Center "De Doelen", Rotterdam, the Netherlands. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

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