Engineering & Materials Science
Focused ion beams
100%
Tomography
86%
Plasmas
82%
Scanning electron microscopy
71%
Silicon
70%
Topography
40%
Resins
32%
Beam plasma interactions
28%
Specimen preparation
27%
Ion beams
25%
Xenon
24%
Atomic force microscopy
22%
Microscopic examination
19%
Crystalline materials
18%
Rigidity
18%
Sampling
12%
Throughput
12%
Physics & Astronomy
tomography
71%
ion beams
69%
scanning electron microscopy
58%
silicon
48%
beam interactions
47%
resins
35%
topography
33%
preparation
26%
configurations
19%
machining
18%
rigidity
18%
xenon
18%
sampling
15%
atomic force microscopy
13%
microscopy
12%
Chemistry
Ion Beam
99%
Black
80%
Plasma
55%
Volume
51%
Scanning Electron Microscopy
42%
Sample Preparation
15%
Sampling
14%
Atomic Force Microscopy
14%
Amorphous Material
12%
Nanomaterial
11%
Surface
5%