Abstract
The laser cleaning of alumina particles on glass and silica substrates was discussed. It was found that the threshold fluence for particle removal of silica was approximately eight times higher than that for microscope slides, when so prepared. The analysis suggested the threshold fluence for silica was about 15 times greater that for glass.
| Original language | English |
|---|---|
| Pages (from-to) | 8862-8866 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 93 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1 Jun 2003 |
Bibliographical note
Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of applied physics, Vol. 93, Issue 11, pp.8862-8866, and may be found at http://link.aip.org/link/?JAPIAU/93/8862/1.Fingerprint
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