@inbook{6db5422ebc7343ae8a3d0ea148a49e9c,
title = "Leakage current and thermal effects",
abstract = "This chapter discusses two very important aspects of the device and their modeling in BSIMIMG: leakage currents and thermal effects. Leakage currents are undesirable with multiplesources and mechanisms causing them. Each leakage current source and its modeling in BSIMIMG model is described in different sub-sections of this chapter. The ambient temperature changes several key device parameters, in-turn affecting its terminal behavior. These parametervariations are modeled with ambient temperature as an input to the model. The modeling formulations and the associated model parameters are described in this chapter.",
author = "Sourabh Khandelwal and Pragya Kushwaha",
year = "2019",
doi = "10.1016/B978-0-08-102401-0.00004-2",
language = "English",
isbn = "9780081024010",
series = "Woodhead Publishing Series in Electronic and Optical Materials",
publisher = "Elsevier",
pages = "65--87",
editor = "Chenming Hu and Sourabh Khandelwal and Chauhan, {Yogesh Singh} and Thomas Mckay and Josef Watts and Duarte, {Juan Pablo} and Pragya Kushwaha and Harshit Agarwal",
booktitle = "Industry standard FDSOI compact model BSIM-IMG for IC design",
address = "United States",
}