Learning representations of ultrahigh-dimensional data for random distance-based outlier detection

Guansong Pang, Longbing Cao, Ling Chen, Huan Liu

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

184 Citations (Scopus)

Abstract

Learning expressive low-dimensional representations of ultrahigh-dimensional data, e.g., data with thousands/millions of features, has been a major way to enable learning methods to address the curse of dimensionality. However, existing unsupervised representation learning methods mainly focus on preserving the data regularity information and learning the representations independently of subsequent outlier detection methods, which can result in suboptimal and unstable performance of detecting irregularities (i.e., outliers). 

This paper introduces a ranking model-based framework, called RAMODO, to address this issue. RAMODO unifies representation learning and outlier detection to learn low-dimensional representations that are tailored for a state-of-the-art outlier detection approach - the random distance-based approach. This customized learning yields more optimal and stable representations for the targeted outlier detectors. Additionally, RAMODO can leverage little labeled data as prior knowledge to learn more expressive and application-relevant representations. We instantiate RAMODO to an efficient method called REPEN to demonstrate the performance of RAMODO. 

Extensive empirical results on eight real-world ultrahigh dimensional data sets show that REPEN (i) enables a random distance-based detector to obtain significantly better AUC performance and two orders of magnitude speedup; (ii) performs substantially better and more stably than four state-of-the-art representation learning methods; and (iii) leverages less than 1% labeled data to achieve up to 32% AUC improvement.

Original languageEnglish
Title of host publicationKDD '18
Subtitle of host publicationproceedings of the 24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Place of PublicationNew York
PublisherAssociation for Computing Machinery (ACM)
Pages2041-2050
Number of pages10
ISBN (Electronic)9781450355520
DOIs
Publication statusPublished - 2018
Externally publishedYes
Event24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2018 - London, United Kingdom
Duration: 19 Aug 201823 Aug 2018

Conference

Conference24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2018
Country/TerritoryUnited Kingdom
CityLondon
Period19/08/1823/08/18

Keywords

  • Outlier Detection
  • Representation Learning
  • Ultrahigh-dimensional Data
  • Dimension Reduction

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