Abstract
An undoped and a compensated a-Si:H sample have been degraded by 17-34 ns laser pulses and by steady light (CW) at 78K and 300K. The light-induced defect concentration N is monitored by the increase in subgap absorption α. For the same change in a α pulses degrade the photoconductivity σp more than CW light and more strongly for exposures at 78K than at 300K. The lack of correlation between σp and N suggests that light soaking causes additional damage besides an increase in N. This additional effect is more pronounced for pulse and low temperature exposures.
Original language | English |
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Pages (from-to) | 245-250 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 377 |
Publication status | Published - 1995 |
Externally published | Yes |