Successful X-ray excited Auger coincidence experiments from solid surfaces have been performed in the past few years. We model the count rate and signal-to-background ratio for an electron-excited Auger coincidence experiment on a silicon surface in reflection mode geometry. The dominant process leading to coincidences are shown to be of second order. A typical experiment is considered, with experimental parameters being used where required. We conclude that while such an experiment is technically feasible, the X-ray excited coincidence Auger experiments are to be preferred.