Limits to Auger-electron core-loss electron coincidence spectroscopy

A. T. Stelbovics*, B. D. Todd, S. M. Thurgate, B. Lohmann

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)


    Successful X-ray excited Auger coincidence experiments from solid surfaces have been performed in the past few years. We model the count rate and signal-to-background ratio for an electron-excited Auger coincidence experiment on a silicon surface in reflection mode geometry. The dominant process leading to coincidences are shown to be of second order. A typical experiment is considered, with experimental parameters being used where required. We conclude that while such an experiment is technically feasible, the X-ray excited coincidence Auger experiments are to be preferred.

    Original languageEnglish
    Pages (from-to)193-201
    Number of pages9
    JournalSurface Science
    Issue number1-2
    Publication statusPublished - 1 Nov 1992


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