Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Zhong Tao Jiang*, Stephen M. Thurgate, Peter Wilkie

*Corresponding author for this work

    Research output: Contribution to journalArticle

    17 Citations (Scopus)

    Abstract

    In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3 VV from Cu. Comparison of the L3 VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.

    Original languageEnglish
    Pages (from-to)287-290
    Number of pages4
    JournalSurface and Interface Analysis
    Volume31
    Issue number4
    DOIs
    Publication statusPublished - Apr 2001

    Keywords

    • Auger photoelectron spectroscopy
    • Copper
    • X-ray photoelectron spectroscopy

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