Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Zhong Tao Jiang; Stephen M. Thurgate; Peter Wilkie

doi:10.1002/sia.990

Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Zhong Tao Jiang^*, Stephen M. Thurgate, Peter Wilkie

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

In this study, we present Cu L₃M₄₅M₄₅ Auger spectra in coincidence with Cu 2p_3/2 from the oxidized surface of Cu (i.e. CuO_x/Cu) and Cu 2p_3/2 lines in coincidence with Auger ¹G and ³F terms of Cu L₃ VV from Cu. Comparison of the L₃ VV line structures of CuO_x/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuO_x/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuO_x surface. The asymmetric broadening of the Cu 2p_3/2 lines in coincidence with ¹G and ³F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.

Original language	English
Pages (from-to)	287-290
Number of pages	4
Journal	Surface and Interface Analysis
Volume	31
Issue number	4
DOIs	https://doi.org/10.1002/sia.990
Publication status	Published - Apr 2001

Keywords

Auger photoelectron spectroscopy
Copper
X-ray photoelectron spectroscopy

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10.1002/sia.990

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title = "Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)",

abstract = "In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3 VV from Cu. Comparison of the L3 VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.",

keywords = "Auger photoelectron spectroscopy, Copper, X-ray photoelectron spectroscopy",

author = "Jiang, {Zhong Tao} and Thurgate, {Stephen M.} and Peter Wilkie",

year = "2001",

month = apr,

doi = "10.1002/sia.990",

language = "English",

volume = "31",

pages = "287--290",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley & Sons",

number = "4",

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TY - JOUR

T1 - Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

AU - Jiang, Zhong Tao

AU - Thurgate, Stephen M.

AU - Wilkie, Peter

PY - 2001/4

Y1 - 2001/4

N2 - In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3 VV from Cu. Comparison of the L3 VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.

AB - In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3 VV from Cu. Comparison of the L3 VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.

KW - Auger photoelectron spectroscopy

KW - Copper

KW - X-ray photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=0035304950&partnerID=8YFLogxK

U2 - 10.1002/sia.990

DO - 10.1002/sia.990

M3 - Article

AN - SCOPUS:0035304950

SN - 0142-2421

VL - 31

SP - 287

EP - 290

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 4

ER -

Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Abstract

Keywords

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