Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise

J. P. Toomey; D. M. Kane

doi:10.1109/COMMAD.2010.5699776

Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise

J. P. Toomey, D. M. Kane

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

2 Citations (Scopus)

Abstract

Recent studies of nonlinear dynamics in semiconductor-laser-with-optical- feedback (SLwOF) systems have discovered that very low levels of optical feedback enhance several, specific, narrow frequency bands within the broad bandwidth of the noise of the free running laser, in a systematic way as the injection current is increased [1]. Similar frequency features are also extracted when completing instantaneous frequency measurement (IFM) on the real-time output power data from semiconductor lasers operated at low injection current [2]. We report further investigation of the nonlinear behaviour of these noise peaks in a SLwOF system and their relevance as driving frequencies in the nonlinear dynamics of the SLwOF systems. The significance of this nonlinear noise measurement to device specification is also evaluated.

Original language	English
Title of host publication	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	55-56
Number of pages	2
ISBN (Print)	9781424473328
DOIs	https://doi.org/10.1109/COMMAD.2010.5699776
Publication status	Published - 2010
Event	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 - Canberra, ACT, Australia Duration: 12 Dec 2010 → 15 Dec 2010

Other

Other	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010
Country/Territory	Australia
City	Canberra, ACT
Period	12/12/10 → 15/12/10

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10.1109/COMMAD.2010.5699776

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Toomey, J. P., & Kane, D. M. (2010). Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise. In 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings (pp. 55-56). Article 5699776 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/COMMAD.2010.5699776

@inproceedings{fc9e09bb850b4929ab16165389074663,

title = "Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise",

abstract = "Recent studies of nonlinear dynamics in semiconductor-laser-with-optical- feedback (SLwOF) systems have discovered that very low levels of optical feedback enhance several, specific, narrow frequency bands within the broad bandwidth of the noise of the free running laser, in a systematic way as the injection current is increased [1]. Similar frequency features are also extracted when completing instantaneous frequency measurement (IFM) on the real-time output power data from semiconductor lasers operated at low injection current [2]. We report further investigation of the nonlinear behaviour of these noise peaks in a SLwOF system and their relevance as driving frequencies in the nonlinear dynamics of the SLwOF systems. The significance of this nonlinear noise measurement to device specification is also evaluated.",

author = "Toomey, {J. P.} and Kane, {D. M.}",

year = "2010",

doi = "10.1109/COMMAD.2010.5699776",

language = "English",

isbn = "9781424473328",

pages = "55--56",

booktitle = "2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 ; Conference date: 12-12-2010 Through 15-12-2010",

}

Toomey, JP & Kane, DM 2010, Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise. in 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings., 5699776, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 55-56, 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010, Canberra, ACT, Australia, 12/12/10. https://doi.org/10.1109/COMMAD.2010.5699776

Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise. / Toomey, J. P.; Kane, D. M.
2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2010. p. 55-56 5699776.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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T1 - Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise

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N2 - Recent studies of nonlinear dynamics in semiconductor-laser-with-optical- feedback (SLwOF) systems have discovered that very low levels of optical feedback enhance several, specific, narrow frequency bands within the broad bandwidth of the noise of the free running laser, in a systematic way as the injection current is increased [1]. Similar frequency features are also extracted when completing instantaneous frequency measurement (IFM) on the real-time output power data from semiconductor lasers operated at low injection current [2]. We report further investigation of the nonlinear behaviour of these noise peaks in a SLwOF system and their relevance as driving frequencies in the nonlinear dynamics of the SLwOF systems. The significance of this nonlinear noise measurement to device specification is also evaluated.

AB - Recent studies of nonlinear dynamics in semiconductor-laser-with-optical- feedback (SLwOF) systems have discovered that very low levels of optical feedback enhance several, specific, narrow frequency bands within the broad bandwidth of the noise of the free running laser, in a systematic way as the injection current is increased [1]. Similar frequency features are also extracted when completing instantaneous frequency measurement (IFM) on the real-time output power data from semiconductor lasers operated at low injection current [2]. We report further investigation of the nonlinear behaviour of these noise peaks in a SLwOF system and their relevance as driving frequencies in the nonlinear dynamics of the SLwOF systems. The significance of this nonlinear noise measurement to device specification is also evaluated.

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EP - 56

BT - 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings

PB - Institute of Electrical and Electronics Engineers (IEEE)

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T2 - 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010

Y2 - 12 December 2010 through 15 December 2010

ER -

Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise

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