Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang*, Wen Jun Toe, Alexander Hartstone, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

Original languageEnglish
Title of host publicationOptical Trapping and Optical Micromanipulation IX
EditorsKishan Dholakia, Gabriel C Spading
Place of PublicationBellingham, WA
PublisherSPIE
Pages1-7
Number of pages7
Volume8458
ISBN (Print)9780819491756
DOIs
Publication statusPublished - 2012
EventOptical Trapping and Optical Micromanipulation IX - San Diego, CA, United States
Duration: 12 Aug 201216 Aug 2012

Other

OtherOptical Trapping and Optical Micromanipulation IX
CountryUnited States
CitySan Diego, CA
Period12/08/1216/08/12

Keywords

  • Indium phosphide
  • Nanowires
  • Optical tweezers
  • Photoluminescence mapping

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