Material-loaded high q-factor slot resonator and measurement of relative permittivity

A. Abdel-Rahman; M. S. Kheir; A. K. Verma; A. Omar

doi:10.2528/PIERC10012906

Material-loaded high q-factor slot resonator and measurement of relative permittivity

A. Abdel-Rahman, M. S. Kheir, A. K. Verma, A. Omar

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We introduce a new slot resonator in the ground plane of a microstrip that is loaded with a parallel plate capacitor. The loaded slot has a 73% reduced length. Its unloaded Q-factor is 98 which is 91% higher than that of an ordinary slot. It is suitable to reject the narrow band unwanted signal. The proposed high Q-factor compact slot resonator also suppresses the undesired spurious high frequency response of the unloaded slot resonator. The structure is further used to determine the unknown dielectric constant of a sheet material with 0.04 variation in ε_r.

Original language	English
Pages (from-to)	67-76
Number of pages	10
Journal	Progress In Electromagnetics Research C
Volume	13
DOIs	https://doi.org/10.2528/PIERC10012906
Publication status	Published - 2010
Externally published	Yes

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@article{eff00794e1754417ba06fb993f32b3af,

title = "Material-loaded high q-factor slot resonator and measurement of relative permittivity",

abstract = "We introduce a new slot resonator in the ground plane of a microstrip that is loaded with a parallel plate capacitor. The loaded slot has a 73% reduced length. Its unloaded Q-factor is 98 which is 91% higher than that of an ordinary slot. It is suitable to reject the narrow band unwanted signal. The proposed high Q-factor compact slot resonator also suppresses the undesired spurious high frequency response of the unloaded slot resonator. The structure is further used to determine the unknown dielectric constant of a sheet material with 0.04 variation in εr.",

author = "A. Abdel-Rahman and Kheir, {M. S.} and Verma, {A. K.} and A. Omar",

year = "2010",

doi = "10.2528/PIERC10012906",

language = "English",

volume = "13",

pages = "67--76",

journal = "Progress In Electromagnetics Research C",

issn = "1937-8718",

publisher = "Electromagnetics Academy",

}

TY - JOUR

T1 - Material-loaded high q-factor slot resonator and measurement of relative permittivity

AU - Abdel-Rahman, A.

AU - Kheir, M. S.

AU - Verma, A. K.

AU - Omar, A.

PY - 2010

Y1 - 2010

N2 - We introduce a new slot resonator in the ground plane of a microstrip that is loaded with a parallel plate capacitor. The loaded slot has a 73% reduced length. Its unloaded Q-factor is 98 which is 91% higher than that of an ordinary slot. It is suitable to reject the narrow band unwanted signal. The proposed high Q-factor compact slot resonator also suppresses the undesired spurious high frequency response of the unloaded slot resonator. The structure is further used to determine the unknown dielectric constant of a sheet material with 0.04 variation in εr.

AB - We introduce a new slot resonator in the ground plane of a microstrip that is loaded with a parallel plate capacitor. The loaded slot has a 73% reduced length. Its unloaded Q-factor is 98 which is 91% higher than that of an ordinary slot. It is suitable to reject the narrow band unwanted signal. The proposed high Q-factor compact slot resonator also suppresses the undesired spurious high frequency response of the unloaded slot resonator. The structure is further used to determine the unknown dielectric constant of a sheet material with 0.04 variation in εr.

UR - http://www.scopus.com/inward/record.url?scp=78651556873&partnerID=8YFLogxK

U2 - 10.2528/PIERC10012906

DO - 10.2528/PIERC10012906

M3 - Article

AN - SCOPUS:78651556873

VL - 13

SP - 67

EP - 76

JO - Progress In Electromagnetics Research C

JF - Progress In Electromagnetics Research C

SN - 1937-8718

ER -

Material-loaded high q-factor slot resonator and measurement of relative permittivity

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