Measuring nanoparticle size using optical surface profilers

Douglas J. Little; Deb M. Kane

doi:10.1364/OE.21.015664

Measuring nanoparticle size using optical surface profilers

Douglas J. Little, Deb M. Kane

MQ Photonics Research Centre

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

10 Downloads (Pure)

Abstract

Optical surface profilers are state-of-the-art instruments for measuring surface height profiles. They are not conventionally applied to nanoparticle measurements due to the presence of diffraction artifacts. Here we use a theoretical model based on wave-optics to account for diffractionbased artifacts in optical surface profilers. This then enables accurate measurement of nanoparticles size of a known geometry. The model is developed for both phase shifting interferometry and vertical scanning interferometry modes of operation. It is demonstrated that nanosphere radii as small as 12 nm, and nano-cylinder radii as small as 10-15 nm can be measured from a standard profile measurement using phase shifted interferometry interpreted using the wave-optics approach.

Original language	English
Pages (from-to)	15664-15675
Number of pages	12
Journal	Optics Express
Volume	21
Issue number	13
DOIs	https://doi.org/10.1364/OE.21.015664
Publication status	Published - 1 Jul 2013

Bibliographical note

This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-13-15664]. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Access to Document

10.1364/OE.21.015664

Publisher version (open access).pdfFinal published version, 262 KB

Cite this

@article{1fd1545dcce74f9c871fe5518e20414c,

title = "Measuring nanoparticle size using optical surface profilers",

abstract = "Optical surface profilers are state-of-the-art instruments for measuring surface height profiles. They are not conventionally applied to nanoparticle measurements due to the presence of diffraction artifacts. Here we use a theoretical model based on wave-optics to account for diffractionbased artifacts in optical surface profilers. This then enables accurate measurement of nanoparticles size of a known geometry. The model is developed for both phase shifting interferometry and vertical scanning interferometry modes of operation. It is demonstrated that nanosphere radii as small as 12 nm, and nano-cylinder radii as small as 10-15 nm can be measured from a standard profile measurement using phase shifted interferometry interpreted using the wave-optics approach.",

author = "Little, {Douglas J.} and Kane, {Deb M.}",

note = "This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-13-15664]. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.",

year = "2013",

month = jul,

day = "1",

doi = "10.1364/OE.21.015664",

language = "English",

volume = "21",

pages = "15664--15675",

journal = "Optics Express",

issn = "1094-4087",

publisher = "OPTICAL SOC AMER",

number = "13",

}

TY - JOUR

T1 - Measuring nanoparticle size using optical surface profilers

AU - Little, Douglas J.

AU - Kane, Deb M.

N1 - This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-13-15664]. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

PY - 2013/7/1

Y1 - 2013/7/1

N2 - Optical surface profilers are state-of-the-art instruments for measuring surface height profiles. They are not conventionally applied to nanoparticle measurements due to the presence of diffraction artifacts. Here we use a theoretical model based on wave-optics to account for diffractionbased artifacts in optical surface profilers. This then enables accurate measurement of nanoparticles size of a known geometry. The model is developed for both phase shifting interferometry and vertical scanning interferometry modes of operation. It is demonstrated that nanosphere radii as small as 12 nm, and nano-cylinder radii as small as 10-15 nm can be measured from a standard profile measurement using phase shifted interferometry interpreted using the wave-optics approach.

AB - Optical surface profilers are state-of-the-art instruments for measuring surface height profiles. They are not conventionally applied to nanoparticle measurements due to the presence of diffraction artifacts. Here we use a theoretical model based on wave-optics to account for diffractionbased artifacts in optical surface profilers. This then enables accurate measurement of nanoparticles size of a known geometry. The model is developed for both phase shifting interferometry and vertical scanning interferometry modes of operation. It is demonstrated that nanosphere radii as small as 12 nm, and nano-cylinder radii as small as 10-15 nm can be measured from a standard profile measurement using phase shifted interferometry interpreted using the wave-optics approach.

UR - http://www.scopus.com/inward/record.url?scp=84879924765&partnerID=8YFLogxK

U2 - 10.1364/OE.21.015664

DO - 10.1364/OE.21.015664

M3 - Article

C2 - 23842352

AN - SCOPUS:84879924765

VL - 21

SP - 15664

EP - 15675

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 13

ER -

Measuring nanoparticle size using optical surface profilers

Abstract

Bibliographical note

Access to Document

Other files and links

Fingerprint

National Measurement Institute Prize

Cite this

Measuring nanoparticle size using optical surface profilers

Abstract

Bibliographical note

Access to Document

Other files and links

Fingerprint

Prizes

National Measurement Institute Prize

Cite this