Method for determining correct timing for pulsed-I/V measurement of GaAs FETs

A. Parker*, J. Scott

*Corresponding author for this work

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Pulsed voltage testing of GaAs FETs is now widely used, and pulses of widely varying periods and repetition rates are reported, without justification. A method for determining both necessary and optimum values of these timing parameters is suggested, and measured results are presented.

Original languageEnglish
Pages (from-to)1697-1698
Number of pages2
JournalElectronics Letters
Volume31
Issue number19
DOIs
Publication statusPublished - 1 Jan 1995

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