Method for determining correct timing for pulsed-I/V measurement of GaAs FETs

A. Parker; J. Scott

doi:10.1049/el:19951143

Method for determining correct timing for pulsed-I/V measurement of GaAs FETs

A. Parker^*, J. Scott

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

Pulsed voltage testing of GaAs FETs is now widely used, and pulses of widely varying periods and repetition rates are reported, without justification. A method for determining both necessary and optimum values of these timing parameters is suggested, and measured results are presented.

Original language	English
Pages (from-to)	1697-1698
Number of pages	2
Journal	Electronics Letters
Volume	31
Issue number	19
DOIs	https://doi.org/10.1049/el:19951143
Publication status	Published - 1 Jan 1995

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title = "Method for determining correct timing for pulsed-I/V measurement of GaAs FETs",

abstract = "Pulsed voltage testing of GaAs FETs is now widely used, and pulses of widely varying periods and repetition rates are reported, without justification. A method for determining both necessary and optimum values of these timing parameters is suggested, and measured results are presented.",

author = "A. Parker and J. Scott",

year = "1995",

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doi = "10.1049/el:19951143",

language = "English",

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N2 - Pulsed voltage testing of GaAs FETs is now widely used, and pulses of widely varying periods and repetition rates are reported, without justification. A method for determining both necessary and optimum values of these timing parameters is suggested, and measured results are presented.

AB - Pulsed voltage testing of GaAs FETs is now widely used, and pulses of widely varying periods and repetition rates are reported, without justification. A method for determining both necessary and optimum values of these timing parameters is suggested, and measured results are presented.

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JO - Electronics Letters

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Method for determining correct timing for pulsed-I/V measurement of GaAs FETs

Abstract

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