TY - GEN
T1 - Microwave device model validity assessment for statistical analysis
AU - Heimlich, Michael C.
AU - Gutta, Venkata
AU - Parker, Anthony Edward
AU - Fattorini, Tony
N1 - Copyright 2009 IEEE. Reprinted from Asia Pacific Microwave Conference 2009 : Suntec Singapore International Convention & Exhibition Centre, December 7-10, 2009, Singapore. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2009
Y1 - 2009
N2 - model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.
AB - model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.
UR - http://www.scopus.com/inward/record.url?scp=77950638127&partnerID=8YFLogxK
U2 - 10.1109/APMC.2009.5384438
DO - 10.1109/APMC.2009.5384438
M3 - Conference proceeding contribution
AN - SCOPUS:77950638127
SN - 9781424428014
SP - 1513
EP - 1516
BT - Asia Pacific Microwave Conference, APMC 2009
A2 - Li, Joshua Le-Wei
A2 - Li, Er-Ping
A2 - Zhu, Lei
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Piscataway, NJ
T2 - Asia Pacific Microwave Conference 2009, APMC 2009
Y2 - 7 December 2009 through 10 December 2009
ER -