Microwave device model validity assessment for statistical analysis

Michael C. Heimlich, Venkata Gutta, Anthony Edward Parker, Tony Fattorini

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model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.

Original languageEnglish
Title of host publicationAsia Pacific Microwave Conference, APMC 2009
EditorsJoshua Le-Wei Li, Er-Ping Li, Lei Zhu
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages4
ISBN (Electronic)9781424428021
ISBN (Print)9781424428014
Publication statusPublished - 2009
EventAsia Pacific Microwave Conference 2009, APMC 2009 - Singapore, Singapore
Duration: 7 Dec 200910 Dec 2009


OtherAsia Pacific Microwave Conference 2009, APMC 2009

Bibliographical note

Copyright 2009 IEEE. Reprinted from Asia Pacific Microwave Conference 2009 : Suntec Singapore International Convention & Exhibition Centre, December 7-10, 2009, Singapore. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.


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