Microwave device model validity assessment for statistical analysis

Michael C. Heimlich; Venkata Gutta; Anthony Edward Parker; Tony Fattorini

doi:10.1109/APMC.2009.5384438

Microwave device model validity assessment for statistical analysis

Michael C. Heimlich, Venkata Gutta, Anthony Edward Parker, Tony Fattorini

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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Abstract

model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.

Original language	English
Title of host publication	Asia Pacific Microwave Conference, APMC 2009
Editors	Joshua Le-Wei Li, Er-Ping Li, Lei Zhu
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1513-1516
Number of pages	4
ISBN (Electronic)	9781424428021
ISBN (Print)	9781424428014
DOIs	https://doi.org/10.1109/APMC.2009.5384438
Publication status	Published - 2009
Event	Asia Pacific Microwave Conference 2009, APMC 2009 - Singapore, Singapore Duration: 7 Dec 2009 → 10 Dec 2009

Other

Other	Asia Pacific Microwave Conference 2009, APMC 2009
Country/Territory	Singapore
City	Singapore
Period	7/12/09 → 10/12/09

Bibliographical note

Copyright 2009 IEEE. Reprinted from Asia Pacific Microwave Conference 2009 : Suntec Singapore International Convention & Exhibition Centre, December 7-10, 2009, Singapore. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie Universityâ€™s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

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@inproceedings{609396d984304c619c108f37f813527e,

title = "Microwave device model validity assessment for statistical analysis",

abstract = "model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.",

author = "Heimlich, \{Michael C.\} and Venkata Gutta and Parker, \{Anthony Edward\} and Tony Fattorini",

note = "Copyright 2009 IEEE. Reprinted from Asia Pacific Microwave Conference 2009 : Suntec Singapore International Convention \& Exhibition Centre, December 7-10, 2009, Singapore. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University{\^a}€{\texttrademark}s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.; Asia Pacific Microwave Conference 2009, APMC 2009 ; Conference date: 07-12-2009 Through 10-12-2009",

year = "2009",

doi = "10.1109/APMC.2009.5384438",

language = "English",

isbn = "9781424428014",

pages = "1513--1516",

editor = "Li, \{Joshua Le-Wei\} and Er-Ping Li and Lei Zhu",

booktitle = "Asia Pacific Microwave Conference, APMC 2009",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Heimlich, MC, Gutta, V, Parker, AE & Fattorini, T 2009, Microwave device model validity assessment for statistical analysis. in JL-W Li, E-P Li & L Zhu (eds), Asia Pacific Microwave Conference, APMC 2009., 5384438, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1513-1516, Asia Pacific Microwave Conference 2009, APMC 2009, Singapore, Singapore, 7/12/09. https://doi.org/10.1109/APMC.2009.5384438

Microwave device model validity assessment for statistical analysis. / Heimlich, Michael C.; Gutta, Venkata; Parker, Anthony Edward et al.
Asia Pacific Microwave Conference, APMC 2009. ed. / Joshua Le-Wei Li; Er-Ping Li; Lei Zhu. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2009. p. 1513-1516 5384438.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Microwave device model validity assessment for statistical analysis

AU - Heimlich, Michael C.

AU - Gutta, Venkata

AU - Parker, Anthony Edward

AU - Fattorini, Tony

N1 - Copyright 2009 IEEE. Reprinted from Asia Pacific Microwave Conference 2009 : Suntec Singapore International Convention & Exhibition Centre, December 7-10, 2009, Singapore. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie Universityâ€™s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

PY - 2009

Y1 - 2009

N2 - model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.

AB - model accuracy is a key consideration when using circuit simulation for microwave designs in general but normally ignored in statistical analysis. A measure of model validity against process variation, MAP, is developed from theoretical considerations. A demonstration of MAP is given for the simple case of a microstrip line and the industry-standard MLIN model. More complex cases are examined for coupled differential microstrip on module for linear design and MMIC HBT diodes for nonlinear design. The impact on MAP of both process variations and model changes is demonstrated. Limitations and extensions to the technique are discussed for other factors impacting the selection of models based on their accuracy.

UR - https://www.scopus.com/pages/publications/77950638127

U2 - 10.1109/APMC.2009.5384438

DO - 10.1109/APMC.2009.5384438

M3 - Conference proceeding contribution

AN - SCOPUS:77950638127

SN - 9781424428014

SP - 1513

EP - 1516

BT - Asia Pacific Microwave Conference, APMC 2009

A2 - Li, Joshua Le-Wei

A2 - Li, Er-Ping

A2 - Zhu, Lei

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - Asia Pacific Microwave Conference 2009, APMC 2009

Y2 - 7 December 2009 through 10 December 2009

ER -

Microwave device model validity assessment for statistical analysis

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