Mid-infrared luminescence of Bi-Te series single crystals

Haibo Xing, Liangbi Su*, Xiantao Jiang, Xiao Fan, Xiaobo Qian, Huili Tang, Jun Xu

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Well-crystallized Bi-Te single crystals with different ratios were grown in vertical Bridgman method. Broadband emission was detected in 1900-3000 nm. Annealing treatment and XPS test revealed the emission center might be Bi clusters. The forming process and energy level transition of Bi clusters were given in this paper.

Original languageEnglish
Pages (from-to)1982-1985
Number of pages4
JournalOptical Materials
Volume36
Issue number12
DOIs
Publication statusPublished - Oct 2014
Externally publishedYes

Keywords

  • single crystal
  • Bi clusters
  • mid-infrared luminescence

Fingerprint Dive into the research topics of 'Mid-infrared luminescence of Bi-Te series single crystals'. Together they form a unique fingerprint.

  • Cite this

    Xing, H., Su, L., Jiang, X., Fan, X., Qian, X., Tang, H., & Xu, J. (2014). Mid-infrared luminescence of Bi-Te series single crystals. Optical Materials, 36(12), 1982-1985. https://doi.org/10.1016/j.optmat.2013.12.030