Abstract
Comprehensive mid-IR nonlinear measurements of SiGe waveguides performed in the picosecond and femtosecond regime and compared to numerical calculations are reported. Nonlinear properties of SiGe waveguides in the mid-IR are extracted.
Original language | English |
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Title of host publication | 2015 IEEE Summer Topicals Meeting Series, SUM 2015 |
Place of Publication | Picataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 59-60 |
Number of pages | 2 |
ISBN (Electronic) | 9781479974689, 9781479974672 |
ISBN (Print) | 9781479974696 |
DOIs | |
Publication status | Published - 9 Sept 2015 |
Externally published | Yes |
Event | IEEE Summer Topicals Meeting Series, SUM 2015 - Nassau, Bahamas Duration: 13 Jul 2015 → 15 Jul 2015 |
Other
Other | IEEE Summer Topicals Meeting Series, SUM 2015 |
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Country/Territory | Bahamas |
City | Nassau |
Period | 13/07/15 → 15/07/15 |