Abstract
Comprehensive mid-IR nonlinear measurements of SiGe waveguides performed in the picosecond and femtosecond regime and compared to numerical calculations are reported. Nonlinear properties of SiGe waveguides in the mid-IR are extracted.
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE Summer Topicals Meeting Series, SUM 2015 |
| Place of Publication | Picataway, NJ |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 59-60 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781479974689, 9781479974672 |
| ISBN (Print) | 9781479974696 |
| DOIs | |
| Publication status | Published - 9 Sept 2015 |
| Externally published | Yes |
| Event | IEEE Summer Topicals Meeting Series, SUM 2015 - Nassau, Bahamas Duration: 13 Jul 2015 → 15 Jul 2015 |
Other
| Other | IEEE Summer Topicals Meeting Series, SUM 2015 |
|---|---|
| Country/Territory | Bahamas |
| City | Nassau |
| Period | 13/07/15 → 15/07/15 |