Abstract
Measurements of minority carrier diffusion lengths for p-type and n-type GaAs were carried out using an electron beam induced current (EBIC) technique. The GaAs material was grown by liquid phase epitaxy (LPE) at the Australian Nuclear Science and Technology Organisation. The diffusion lengths measured for high purity p-type and n-type LPE-GaAs samples were observed to be longer than any previously reported.
| Original language | English |
|---|---|
| Pages (from-to) | 317-325 |
| Number of pages | 9 |
| Journal | Australian Journal of Physics |
| Volume | 46 |
| Issue number | 2 |
| Publication status | Published - 1993 |
Keywords
- SCANNING ELECTRON-MICROSCOPE