Abstract
Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.
Original language | English |
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Title of host publication | CLEO 2017 |
Subtitle of host publication | proceedings |
Place of Publication | Washington, DC |
Publisher | OSA Publishing |
Pages | 1-2 |
Number of pages | 2 |
ISBN (Electronic) | 9781943580279 |
DOIs | |
Publication status | Published - 2017 |
Event | CLEO: Applications and Technology, CLEO_AT 2017 - San Jose, United States Duration: 14 May 2017 → 19 May 2017 |
Other
Other | CLEO: Applications and Technology, CLEO_AT 2017 |
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Country/Territory | United States |
City | San Jose |
Period | 14/05/17 → 19/05/17 |