Mirror enhanced STED super-resolution microscopy

Xusan Yang, Hao Xie, Eric Alonas, Yujia Liu, Xuanze Chen, Philip J. Santangelo, Qiushi Ren, Peng Xi*, Dayong Jin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution


Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.

Original languageEnglish
Title of host publicationCLEO 2017
Subtitle of host publicationproceedings
Place of PublicationWashington, DC
PublisherOSA Publishing
Number of pages2
ISBN (Electronic)9781943580279
Publication statusPublished - 2017
EventCLEO: Applications and Technology, CLEO_AT 2017 - San Jose, United States
Duration: 14 May 201719 May 2017


OtherCLEO: Applications and Technology, CLEO_AT 2017
CountryUnited States
CitySan Jose

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