Mirror enhanced STED super-resolution microscopy

Xusan Yang, Hao Xie, Eric Alonas, Yujia Liu, Xuanze Chen, Philip J. Santangelo, Qiushi Ren, Peng Xi*, Dayong Jin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.

Original languageEnglish
Title of host publicationCLEO 2017
Subtitle of host publicationproceedings
Place of PublicationWashington, DC
PublisherOSA Publishing
Pages1-2
Number of pages2
ISBN (Electronic)9781943580279
DOIs
Publication statusPublished - 2017
EventCLEO: Applications and Technology, CLEO_AT 2017 - San Jose, United States
Duration: 14 May 201719 May 2017

Other

OtherCLEO: Applications and Technology, CLEO_AT 2017
CountryUnited States
CitySan Jose
Period14/05/1719/05/17

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