Abstract
Commercial RF MMIC fabrication process technologies were investigated for fabrication of integrated switching power converters. Pulsed IV characterization of GaN FETs revealed ON resistance dependence on off state bias, and current collapse at high temperatures. The degradation in ON resistance and current collapse can severely impact the efficiency of switching circuits fabricated in these processes.
Original language | English |
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Title of host publication | IEEE 2013 Tencon - Spring, TENCONSpring 2013 - Conference Proceedings |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 277-279 |
Number of pages | 3 |
ISBN (Print) | 9781467363495 |
DOIs | |
Publication status | Published - 2013 |
Event | 2013 1st IEEE TENCON Spring Conference, TENCONSpring 2013 - Sydney, NSW, Australia Duration: 17 Apr 2013 → 19 Apr 2013 |
Other
Other | 2013 1st IEEE TENCON Spring Conference, TENCONSpring 2013 |
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Country/Territory | Australia |
City | Sydney, NSW |
Period | 17/04/13 → 19/04/13 |