Mode profiling of semiconductor nanowire lasers

Dhruv Saxena*, Fan Wang, Qian Gao, Sudha Mokkapati, Hark Hoe Tan, Chennupati Jagadish

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

75 Citations (Scopus)


We experimentally determine the lasing mode(s) in optically pumped semiconductor nanowire lasers. The spatially resolved and angle-resolved far-field emission profiles of single InP nanowire lasers lying horizontally on a SiO2 substrate are characterized in a microphotoluminescence (μ-PL) setup. The experimentally obtained polarization dependent far-field profiles match very well with numerical simulations and enable unambiguous identification of the lasing mode(s). This technique can be applied to characterize lasing modes in other type of nanolasers that are integrated on a substrate in either vertical or horizontal configurations.

Original languageEnglish
Pages (from-to)5342-5348
Number of pages7
JournalNano Letters
Issue number8
Publication statusPublished - 12 Aug 2015


  • Nanowire lasers
  • semiconductor nanowires
  • mode characterization
  • far-field characterization
  • Fourier space imaging


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