Modeling for dispersion of shielded microstrip line using SLR technique

A. K. Verma; Raj Kumar

doi:10.1109/ISSSE.1995.498007

Modeling for dispersion of shielded microstrip line using SLR technique

A. K. Verma^*, Raj Kumar

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

2 Citations (Scopus)

Abstract

We report a new dispersion model for shielded microstrip line in the range 1 ≤ W/h₁ ≤ 10, 2 ≤ h₂/h₁, 0 ≤ f ≤ 20GHz. Model has maximum deviation within 4% against the result of SDA. It has average of maximum deviation within 3.23%. Method is based upon reduction of shielded microstrip line into an equivalent open microstrip line with virtual permittivity which is a function of width of line, shield height and frequency. Over this equivalent virtual substrate Kirchning-Jansen dispersion model has been used. The present model is useful for fast interactive CAD, on the desk top computer.

Original language	English
Title of host publication	Conference Proceedings of the International Symposium on Signals, Systems and Electronics
Place of Publication	Piscataway, N.J.
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	355-358
Number of pages	4
ISBN (Print)	0780325168
DOIs	https://doi.org/10.1109/ISSSE.1995.498007
Publication status	Published - Oct 1995
Externally published	Yes
Event	Proceedings of the 1995 3rd URSI International Symposium on Signals, Systems and Electronics, ISSSE'95 - San Francisco, CA, USA Duration: 25 Oct 1995 → 27 Oct 1995

Other

Other	Proceedings of the 1995 3rd URSI International Symposium on Signals, Systems and Electronics, ISSSE'95
City	San Francisco, CA, USA
Period	25/10/95 → 27/10/95

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10.1109/ISSSE.1995.498007

Cite this

@inproceedings{85951c1b47594d7c8cee9c0d34a55e24,

title = "Modeling for dispersion of shielded microstrip line using SLR technique",

abstract = "We report a new dispersion model for shielded microstrip line in the range 1 ≤ W/h1 ≤ 10, 2 ≤ h2/h1, 0 ≤ f ≤ 20GHz. Model has maximum deviation within 4\% against the result of SDA. It has average of maximum deviation within 3.23\%. Method is based upon reduction of shielded microstrip line into an equivalent open microstrip line with virtual permittivity which is a function of width of line, shield height and frequency. Over this equivalent virtual substrate Kirchning-Jansen dispersion model has been used. The present model is useful for fast interactive CAD, on the desk top computer.",

author = "Verma, \{A. K.\} and Raj Kumar",

year = "1995",

month = oct,

doi = "10.1109/ISSSE.1995.498007",

language = "English",

isbn = "0780325168",

pages = "355--358",

booktitle = "Conference Proceedings of the International Symposium on Signals, Systems and Electronics",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "Proceedings of the 1995 3rd URSI International Symposium on Signals, Systems and Electronics, ISSSE'95 ; Conference date: 25-10-1995 Through 27-10-1995",

}

Verma, AK & Kumar, R 1995, Modeling for dispersion of shielded microstrip line using SLR technique. in Conference Proceedings of the International Symposium on Signals, Systems and Electronics., 498007, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, N.J., pp. 355-358, Proceedings of the 1995 3rd URSI International Symposium on Signals, Systems and Electronics, ISSSE'95, San Francisco, CA, USA, 25/10/95. https://doi.org/10.1109/ISSSE.1995.498007

Modeling for dispersion of shielded microstrip line using SLR technique. / Verma, A. K.; Kumar, Raj.
Conference Proceedings of the International Symposium on Signals, Systems and Electronics. Piscataway, N.J.: Institute of Electrical and Electronics Engineers (IEEE), 1995. p. 355-358 498007.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Modeling for dispersion of shielded microstrip line using SLR technique

AU - Verma, A. K.

AU - Kumar, Raj

PY - 1995/10

Y1 - 1995/10

N2 - We report a new dispersion model for shielded microstrip line in the range 1 ≤ W/h1 ≤ 10, 2 ≤ h2/h1, 0 ≤ f ≤ 20GHz. Model has maximum deviation within 4% against the result of SDA. It has average of maximum deviation within 3.23%. Method is based upon reduction of shielded microstrip line into an equivalent open microstrip line with virtual permittivity which is a function of width of line, shield height and frequency. Over this equivalent virtual substrate Kirchning-Jansen dispersion model has been used. The present model is useful for fast interactive CAD, on the desk top computer.

AB - We report a new dispersion model for shielded microstrip line in the range 1 ≤ W/h1 ≤ 10, 2 ≤ h2/h1, 0 ≤ f ≤ 20GHz. Model has maximum deviation within 4% against the result of SDA. It has average of maximum deviation within 3.23%. Method is based upon reduction of shielded microstrip line into an equivalent open microstrip line with virtual permittivity which is a function of width of line, shield height and frequency. Over this equivalent virtual substrate Kirchning-Jansen dispersion model has been used. The present model is useful for fast interactive CAD, on the desk top computer.

UR - https://www.scopus.com/pages/publications/0029517374

U2 - 10.1109/ISSSE.1995.498007

DO - 10.1109/ISSSE.1995.498007

M3 - Conference proceeding contribution

AN - SCOPUS:0029517374

SN - 0780325168

SP - 355

EP - 358

BT - Conference Proceedings of the International Symposium on Signals, Systems and Electronics

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, N.J.

T2 - Proceedings of the 1995 3rd URSI International Symposium on Signals, Systems and Electronics, ISSSE'95

Y2 - 25 October 1995 through 27 October 1995

ER -

Modeling for dispersion of shielded microstrip line using SLR technique

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