Modeling of photovoltaic array using random forests technique

Ibrahim A. Ibrahim, Azah Mohamed, Tamer Khatib

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

his paper presents a novel technique for modeling of photovoltaic (PV) array using random forests (RFs). Metrological variables such as solar radiation and ambient temperature as well as actual output current of a 3 kWp PV grid-connected system installed at Universiti Kebangsaan Malaysia have been utilized. These data are used to train and validate the proposed RFs model. Three statistical error values, namely, root mean square error (RMSE), mean bias error (MBE), and mean absolute percentage error (MAPE), are used to evaluate the developed model. The results show that the proposed RFs model accurately predicts the output current of the PV system. The RMSE, MAPE, and MBE values of the RFs model are 2.7482%, 8.7151%, and -2.5772%, respectively.
Original languageEnglish
Title of host publication2015 IEEE Conference on Energy Conversion (CENCON)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages390-393
Number of pages4
ISBN (Electronic)9781479985982, 9781479985975
DOIs
Publication statusPublished - 2015
Externally publishedYes
Event2015 IEEE Conference on Energy Conversion - Berjaya Waterfront Hotel, Johor Bahru, Malaysia
Duration: 19 Oct 201520 Oct 2015
Conference number: CFP15CEO-ART
https://ieeemy.org/mysection/?p=2154

Conference

Conference2015 IEEE Conference on Energy Conversion
Abbreviated titleCENCON 2015
CountryMalaysia
CityJohor Bahru
Period19/10/1520/10/15
Internet address

Keywords

  • modeling of PV systems
  • random forests
  • performance evaluation

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  • Cite this

    Ibrahim, I. A., Mohamed, A., & Khatib, T. (2015). Modeling of photovoltaic array using random forests technique. In 2015 IEEE Conference on Energy Conversion (CENCON) (pp. 390-393). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CENCON.2015.7409575